online 20 October 2021 Single-ion induced surface modifications on hydrogen-covered Si(001) surfaces—significant difference between slow highly charged and swift heavy ions C Länger, P Ernst, M Bender, [...] 1016/j.nanoen.2020.104612 Available online 13 February 2020 TEM analysis of ion tracks and hillocks produced by swift heavy ions of different velocities in Y3Fe5O12 N. Ishikawa , T. Taguchi, A. Kitamura [...] 2019.2908637 Date of Publication: 11 April 2019 Etched ion tracks in amorphous SiO2 characterized by small angle x-ray scattering: influence of ion energy and etching conditions A Hadley, C Notthoff, P